Our team member, M. Lihter, after a training in the clean room at EPFL during the summer, is again there to produce a new series of 20 nm SiN membranes. Focused Ion Beam (FIB) is used to open micron-sized windows in SiN membranes. SiN membranes with windows are used as a support for graphene layer in which the nanopore is opened afterwards. In SiN membranes without a window a nanopore can be opened by the focused beam of a transmission electron microscope (TEM).